200711 Part of C F Electronics Inc (CAGE Code 55364) with NSN 6625011230093 - Quote Now

Part Number: 200711

Manufacturer: C F Electronics Inc

NSN: 6625-01-123-0093

NIIN: 011230093

Item Name : Test Set Computer

CAGE Code: 55364

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 01

NSN Delivery is your one-stop shop for all the 200711 Test Set Computer products you require that fall under the NSN 6625-01-123-0093, including those like part number 200711 from C F Electronics Inc (CAGE Code 55364) (NIIN 011230093). If you are interested in this particular listing, be sure to fill out and submit the RFQ form provided on this page so that you may receive a competitive quote for your comparisons.

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To make the search for NSN products as simple as possible, we organize our inventory in various ways where you can narrow down results based on a number of parameters. For example, while this product is manufactured by C F Electronics Inc, it was specifically produced under the CAGE Code 55364. Additionally, with the NSN 6625-01-123-0093, one can also know that this product belongs to the Federal Supply Class (FSC) 6625 Electrical and Electronic Properties Measuring and Testing Instruments.

As such, ensuring that you only procure the exact item you need is made easy. If you are ready to begin, submit a quote request today or give us a call or email at your earliest convenience! We look forward to serving you.

Characteristics Data of NSN 6625-01-123-0093, 6625011230093

MRC	Criteria	Characteristic
HGTH	Height	14.000 INCHES NOMINAL
FAAZ	Phase	THREE
ACYN	Ac Voltage Rating	115.0 VOLTS NOMINAL
AEAS	Major Components	CABLES
ACZB	Frequency Rating	400.0 HERTZ NOMINAL
MRC	Decoded Requirement	Clear Text Reply
ACYR	Dc Voltage Rating	27.5 VOLTS NOMINAL
AKWC	Electrical Power Source Relationship	OPERATING
ANPZ	Inclosure Feature	MULTIPLE ITEM W/CARRYING CASE
AGAV	End Item Identification	AGE FOR F-4 AIRCRAFT
AQXY	Test Type For Which Designed	DISPLACEMENT INPUT/OUTPUT SIGNAL;FAULT ISOLATION;AC/DC SIMULATION;ANALYZER SELF TEST